0601377 - FZÚ 2025 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Vo, Trung Phúc - Tkach, O. - Tricot, S. - Sébilleau, D. - Winkelmann, A. - Fedchenko, O. - Lytvynenko, Y. - Vasilyev, D. - Elmers, H.J. - Schönhense, G. - Minár, J.
Analyzing core level photoelectrons by diffraction and circular dichroism via means of first-principle scattering calculations.
AIP Conference Proceedings. Vol. 3251. Melville: American Institute of Physics, 2024 - (Sitek, J.; Vajda, J.; Jamnický, I.), č. článku 020005. ISBN 978-0-7354-5060-8. ISSN 0094-243X.
[International Conference Applied Physics of Condensed Matter (APCOM 2024) /29./. Štrbské Pleso (SK), 19.06.2024-21.06.2024]
Grant CEP: GA ČR(CZ) GA23-04746S
Institucionální podpora: RVO:68378271
Klíčová slova: Hard X-rays * dichroism * electron diffraction * material characterization methods * spectroscopy
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://pubs.aip.org/aip/acp/article/3251/1/020005/3316900/Analyzing-core-level-photoelectrons-by-diffraction
Trvalý odkaz: https://hdl.handle.net/11104/0358537